Invention Grant
- Patent Title: Device and method for assessing X-ray images
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Application No.: US14855893Application Date: 2015-09-16
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Publication No.: US09779498B2Publication Date: 2017-10-03
- Inventor: Frank Dennerlein , Oliver Schütz
- Applicant: Frank Dennerlein , Oliver Schütz
- Applicant Address: DE München
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE München
- Agency: Lempia Summerfield Katz LLC
- Priority: DE102014218893 20140919
- Main IPC: G06T7/00
- IPC: G06T7/00 ; A61B6/02 ; G06K9/46 ; G06T7/20 ; G06T15/00 ; G06T19/00 ; A61B6/00 ; G06T11/00

Abstract:
In the present embodiments, a statement related to an image point or an image region in a reconstructed x-ray image is made in relation to the reliability of the reconstructed grayscale value for the image points of a 2D/3D x-ray image. A confidence level is formed for the grayscale value from a first number of the available x-ray images in relation to a second number of required x-ray images for a complete reconstruction of the respective grayscale value of the 2D/3D x-ray image to be imaged.
Public/Granted literature
- US20160086329A1 DEVICE AND METHOD FOR ASSESSING X-RAY IMAGES Public/Granted day:2016-03-24
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