Invention Grant
- Patent Title: Method and apparatus for ray tracing
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Application No.: US13949818Application Date: 2013-07-24
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Publication No.: US09779537B2Publication Date: 2017-10-03
- Inventor: Won Jong Lee , Young Sam Shin , Jae Don Lee , Seok Yoon Jung
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2012-0080547 20120724
- Main IPC: G06T15/06
- IPC: G06T15/06
Abstract:
Provided is a method and apparatus for ray tracing. A traversal unit to process an input ray to be input among a plurality of traversal units may be determined based on age of each of the plurality of traversal units. Age of the determined traversal unit may be determined based on age of each of rays that are processed by the traversal unit.
Public/Granted literature
- US20140028666A1 METHOD AND APPARATUS FOR RAY TRACING Public/Granted day:2014-01-30
Information query
IPC分类:
| G | 物理 |
| G06 | 计算；推算或计数 |
| G06T | 一般的图像数据处理或产生 |
| G06T15/00 | 3D〔三维〕图像的加工 |
| G06T15/06 | .光线跟踪 |
