Invention Grant
- Patent Title: Inspection device and measurement device
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Application No.: US15109726Application Date: 2014-12-08
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Publication No.: US09779912B2Publication Date: 2017-10-03
- Inventor: Masami Makuuchi , Takahiro Jingu
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2014-007429 20140120
- International Application: PCT/JP2014/082359 WO 20141208
- International Announcement: WO2015/107795 WO 20150723
- Main IPC: H01J37/00
- IPC: H01J37/00 ; H01J37/244 ; G01N21/956 ; G01N21/94 ; G01N21/95 ; H01J37/28 ; A61B5/00 ; H01J49/00

Abstract:
A detection circuit for accurately detecting a very small foreign material and an inspection/measurement device using the same are provided. The inspection/measurement device includes: an irradiation section that irradiates a laser beam to a surface of a specimen; and a detection section that detects scattered light from the surface of the specimen and generates a detection signal. The detection section includes: a photon counting sensor that outputs M output signals from photo-detecting elements of N pixels (M and N are natural numbers, and M
Public/Granted literature
- US20160322193A1 Inspection Device and Measurement Device Public/Granted day:2016-11-03
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