Invention Grant
- Patent Title: Method for manufacturing semiconductor device
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Application No.: US14728134Application Date: 2015-06-02
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Publication No.: US09780070B2Publication Date: 2017-10-03
- Inventor: Akihiro Chida , Yoshiaki Oikawa , Chiho Kawanabe
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Applicant Address: JP Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office
- Agent Eric Robinson
- Priority: JP2010-144127 20100624
- Main IPC: H01L23/00
- IPC: H01L23/00 ; H01L21/56 ; H01L21/78 ; H01L27/12

Abstract:
A first semiconductor substrate is used which has a structure in which a peeling layer is not formed in a section subjected to a first dividing treatment, so that the peeling layer is not exposed at the end surface of a second semiconductor substrate when the second semiconductor substrate is cut out of the first semiconductor substrate. In addition, a supporting material is provided on a layer to be peeled of the second semiconductor substrate before the second semiconductor substrate is subjected to a second dividing treatment.
Public/Granted literature
- US20150333036A1 SEMICONDUCTOR SUBSTRATE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE Public/Granted day:2015-11-19
Information query
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