Invention Grant
- Patent Title: Camera for measuring depth image and method of measuring depth image using the same
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Application No.: US14312954Application Date: 2014-06-24
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Publication No.: US09781318B2Publication Date: 2017-10-03
- Inventor: Jang-woo You , Yong-hwa Park , Hee-sun Yoon
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2013-0150839 20131205
- Main IPC: H04N13/02
- IPC: H04N13/02 ; G01C3/08 ; H04N5/225 ; G01S17/89 ; G01S17/08 ; G01S7/481 ; G01B11/25

Abstract:
Provided are a depth camera and methods of measuring a depth image by using the depth camera. The depth camera is a time-of-flight (TOF) depth camera including: an illumination device that illuminates a patterned light to an object; a filter unit that reduces noise light included in light reflected by the object; and an image sensor that provides a depth image of the object by receiving light that enters through the filter unit. The illumination device includes: a light source; and a patterned light generator that changes the light emitted from the light source into the patterned light. The filter unit includes a band pass filter and an optical modulator. The patterned light generator may be a diffractive optical element or a refractive optical element.
Public/Granted literature
- US20150163474A1 CAMERA FOR MEASURING DEPTH IMAGE AND METHOD OF MEASURING DEPTH IMAGE USING THE SAME Public/Granted day:2015-06-11
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