Invention Grant
- Patent Title: Calibration methods for thick lens model
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Application No.: US14614268Application Date: 2015-02-04
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Publication No.: US09781412B2Publication Date: 2017-10-03
- Inventor: Xue Tu , Pingshan Li , Alexander Berestov
- Applicant: SONY CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: Haverstock & Owens LLP
- Main IPC: H04N17/00
- IPC: H04N17/00 ; G01B9/00 ; G02B15/14 ; G06T7/80
Abstract:
The thick lens calibration method enables better calibration of complex camera devices such as devices with thick lens systems. The thick lens calibration method includes a two step process of calibrating using the distance between a second nodal point and an image sensor, and calibrating using the distance between the first and second nodal point.
Public/Granted literature
- US20160227206A1 CALIBRATION METHODS FOR THICK LENS MODEL Public/Granted day:2016-08-04
Information query
