Invention Grant
- Patent Title: X-ray fluorescence analyzer and measurement position adjusting method therefore
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Application No.: US14805314Application Date: 2015-07-21
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Publication No.: US09791392B2Publication Date: 2017-10-17
- Inventor: Isao Yagi
- Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Tech Science Corporation
- Current Assignee: Hitachi High-Tech Science Corporation
- Current Assignee Address: JP Tokyo
- Agency: Brinks Gilson & Lione
- Priority: JP2014-182919 20140909
- Main IPC: G01N23/223
- IPC: G01N23/223 ; G01N23/22

Abstract:
An X-ray fluorescence analyzer is provided with: a sample stage on which a sample subjected to an analysis is mounted; an X-ray source configured to irradiate the sample with primary X-rays; a detector configured to detect fluorescent X-rays emitted from the sample irradiated with the primary X-rays; an imaging unit configured to capture an image of a predetermined field-of-view area on the sample stage; a display unit configured to display the field-of-view area of the image captured by the imaging unit; and a pointer irradiation unit configured to irradiate the sample stage with a visible light at an irradiation position within an area that is outside the field-of-view area and near the field-of-view area.
Public/Granted literature
- US20160069827A1 X-RAY FLUORESCENCE ANALYZER AND MEASUREMENT POSITION ADJUSTING METHOD THEREFORE Public/Granted day:2016-03-10
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