Invention Grant
- Patent Title: Sample adaptive offset (SAO) adjustment method and apparatus and SAO adjustment determination method and apparatus
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Application No.: US14407327Application Date: 2013-06-11
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Publication No.: US09807392B2Publication Date: 2017-10-31
- Inventor: Elena Alshina , Alexander Alshin
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-Si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-Si
- Agency: Sughrue Mion, PLLC
- International Application: PCT/KR2013/005112 WO 20130611
- International Announcement: WO2013/187654 WO 20131219
- Main IPC: H04N7/12
- IPC: H04N7/12 ; H04N11/02 ; H04N11/04 ; H04N19/13 ; H04N19/117 ; H04N19/136 ; H04N19/186 ; H04N19/174 ; H04N19/82 ; H04N19/157 ; H04N19/44 ; H04N19/86 ; H04N19/91 ; H04N19/159 ; H04N19/176 ; H04N19/196 ; H04N19/46

Abstract:
A sample adaptive offset (SAO) adjustment method, the method includes: obtaining slice SAO parameters with respect to a current slice from a slice header of a received bitstream; obtaining luma SAO use information for a luma component of the current slice and chroma SAO use information for chroma components of the current slice from the slice SAO parameters; determining whether to perform an SAO adjustment on the luma component of the current slice based on the obtained luma SAO use information; and determining whether to perform an SAO adjustment on a first chroma component and a second chroma component of the current slice based on the obtained chroma SAO use information.
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