发明授权
- 专利标题: Measurement system
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申请号: US14570645申请日: 2014-12-15
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公开(公告)号: US09810553B2公开(公告)日: 2017-11-07
- 发明人: Yan Bondar
- 申请人: Micronas GmbH
- 申请人地址: DE Freiburg
- 专利权人: TDK-Micronas GmbH
- 当前专利权人: TDK-Micronas GmbH
- 当前专利权人地址: DE Freiburg
- 代理机构: Muncy, Geissler, Olds & Lowe, P.C.
- 优先权: DE102013020578 20131213
- 主分类号: G01R33/07
- IPC分类号: G01R33/07 ; G01D5/244 ; G01D5/14
摘要:
A measurement system having a first magnetic field sensor and having a magnet for generating a magnetic field, in which the magnet has a first pole face and a second pole face, wherein an axis of rotation is defined perpendicular to the first pole face and perpendicular to the second pole face, wherein the magnet is supported for rotation about the axis of rotation, in which the first magnetic field sensor is positioned facing the first pole face and at a distance from the axis of rotation, in which the magnet has a rotational asymmetry of the flux density in the region of the first pole face, wherein the flux density of the magnet in the first magnetic field sensor can be adjusted between a maximum and a minimum by rotation of the magnet about the axis of rotation.
公开/授权文献
- US20150168124A1 MEASUREMENT SYSTEM 公开/授权日:2015-06-18
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