发明授权
- 专利标题: Etching methods and methods of manufacturing semiconductor devices using the same
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申请号: US15398776申请日: 2017-01-05
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公开(公告)号: US09812332B2公开(公告)日: 2017-11-07
- 发明人: Hyun-Kwan Yu , Woonki Shin , Moonhan Park , DongSuk Shin , HanJin Lim
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- 代理机构: Muir Patent Law, PLLC
- 优先权: KR10-2016-0000996 20160105
- 主分类号: H01L21/461
- IPC分类号: H01L21/461 ; H01L21/306 ; H01L21/02 ; H01L21/8234
摘要:
An etching method is disclosed. The etching method comprises providing on a substrate a structure comprising a recess region formed therein. The recess region includes an inner part and a mouth part whose width is less than that of the inner part. The etching method further comprises performing a clean-then-etch process to remove at least a portion of etching object formed outside the recess region. The performing a clean-then-etch process comprises performing a cleaning process to fill at least a portion of the recess region with a cleaning solution, and performing a wet etch process to the substrate in a state that the cleaning solution remains in the recess region.
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