Invention Grant
- Patent Title: Inspection device of display device and inspection method of display device
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Application No.: US14746427Application Date: 2015-06-22
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Publication No.: US09835565B2Publication Date: 2017-12-05
- Inventor: Wal jun Kim , JoongYoung Ryu , Seung-Young Baeck , Changhyun Ryu , Deok joo Lim
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Yongin-si
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR Yongin-si
- Agency: H.C. Park & Associates, PLC
- Priority: KR10-2014-0192097 20141229
- Main IPC: G01J4/00
- IPC: G01J4/00 ; G01N21/88 ; G01N21/95 ; G01N21/84

Abstract:
An inspection device of a display device includes a first illumination unit providing a first incident light to the display device at a first incident angle, a second illumination unit providing a second incident light to the display device at a second incident angle, a third illumination unit providing a third incident light to the display device at a third incident angle, and a defect detector receiving at least one of a first reflection light obtained from the first incident light reflected by the display device at a first reflection angle, a second reflection light obtained from the second incident light reflected by the display device at a second reflection angle, and a third reflection light obtained from the third incident light reflected by the display device at a third reflection angle to detect defects of the display device.
Public/Granted literature
- US20160187262A1 INSPECTION DEVICE OF DISPLAY DEVICE AND INSPECTION METHOD OF DISPLAY DEVICE Public/Granted day:2016-06-30
Information query