- Patent Title: Vision inspection apparatus and method of detecting Mura thereof
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Application No.: US14601448Application Date: 2015-01-21
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Publication No.: US09880109B2Publication Date: 2018-01-30
- Inventor: Se-Yun Kim , Sung-Jea Ko , Hoi-Sik Moon
- Applicant: Samsung Display Co., Ltd. , KOREA UNIVERSITY RESEARCH AND BUSINESS FOUNDATION
- Applicant Address: KR Yongin-si KR Seoul
- Assignee: Samsung Display Co., Ltd.,Korea University Research and Business Foundation
- Current Assignee: Samsung Display Co., Ltd.,Korea University Research and Business Foundation
- Current Assignee Address: KR Yongin-si KR Seoul
- Agency: H.C. Park & Associates, PLC
- Priority: KR10-2014-0086093 20140709
- Main IPC: G01N21/956
- IPC: G01N21/956 ; G01N21/95

Abstract:
A display apparatus includes a background image estimator configured to restructure a plurality of pixel signals of a panel image corresponding to a plurality of pixels arranged in an (n×m) matrix array into a row dataset and a column dataset and generate a row background image and a column background image with a Mura defect removed from the panel image using the row dataset and the column dataset through a Principal Component Analysis (PCA), a Mura image generator configured to generate a row binary image and a column binary image including a background and the Mura defect using differences between the panel image and the row background image and between the panel image and the column background image.
Public/Granted literature
- US20160012759A1 VISION INSPECTION APPARATUS AND METHOD OF DETECTING MURA THEREOF Public/Granted day:2016-01-14
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