Invention Grant
- Patent Title: Methods and apparatuses for master-slave detection
-
Application No.: US14505740Application Date: 2014-10-03
-
Publication No.: US09881658B2Publication Date: 2018-01-30
- Inventor: Kang-Yong Kim , Jacob Robert Anderson , Huy Vo
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G11C7/20
- IPC: G11C7/20 ; H01L25/065 ; G11C29/00 ; G11C29/32 ; G11C29/50 ; G11C29/04

Abstract:
Apparatuses, master-slave detect circuits, memories, and methods are disclosed. One such method includes performing a master detect phase during which a memory unit in a memory group is determined to be a master memory unit, determining at each memory unit its location relative to other memory units, and determining at each memory unit its location in the memory group based on a total number of slave memory units and its location relative to other memory units.
Public/Granted literature
- US20150058656A1 METHODS AND APPARATUSES FOR MASTER-SLAVE DETECTION Public/Granted day:2015-02-26
Information query