Invention Grant
- Patent Title: Electronic package device for testing a package effect of the device, fabrication method thereof and method for testing electronic package device
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Application No.: US14646138Application Date: 2014-10-21
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Publication No.: US09882133B2Publication Date: 2018-01-30
- Inventor: Dan Wang
- Applicant: BOE Technology Group Co., Ltd.
- Applicant Address: CN Beijing
- Assignee: BOE Technology Group Co., Ltd.
- Current Assignee: BOE Technology Group Co., Ltd.
- Current Assignee Address: CN Beijing
- Agency: Banner & Witcoff, Ltd.
- Priority: CN201410412609 20140820
- International Application: PCT/CN2014/089054 WO 20141021
- International Announcement: WO2016/026203 WO 20160225
- Main IPC: H01L51/00
- IPC: H01L51/00 ; H01L51/52 ; H01L21/66

Abstract:
Embodiments of the disclosure provide an electronic package device and a fabrication method thereof, and a method for testing the electronic package device. The electronic package device comprises a base substrate and a package substrate that are provided opposite to each other, and a sealant provided therebetween. The electronic package device further comprises an electronic function layer provided on a side of the base substrate facing the package substrate, and a laminated film layer and a test lead provided on a side of the package substrate facing the base substrate. The laminated film layer comprises a hygroscopic film adjacent to the package substrate and a piezoelectric film coating surfaces of the hygroscopic film. The piezoelectric film contacts one end of the test lead, and the other end of the test lead passes through the sealant and extends to an exterior of the electronic package device.
Public/Granted literature
- US20160056381A1 Electronic Package Device and Fabrication Method Thereof, Method for Testing Electronic Package Device Public/Granted day:2016-02-25
Information query
IPC分类: