Invention Grant
- Patent Title: Probe-pad qualification
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Application No.: US15176186Application Date: 2016-06-08
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Publication No.: US09885749B2Publication Date: 2018-02-06
- Inventor: Ivan Penjovic , Josef Martin Paul Hennig , Oliver Nagler
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: INFINEON TECHNOLOGIES AG
- Current Assignee: INFINEON TECHNOLOGIES AG
- Current Assignee Address: DE Neubiberg
- Agency: Viering, Jentschura & Partner mbB
- Priority: DE102015109008 20150608
- Main IPC: G01R1/06
- IPC: G01R1/06 ; G01R31/28 ; G01R1/067 ; G01L5/00 ; H05K1/02 ; G01R31/26

Abstract:
A method in accordance with various embodiments may include: measuring a contact force between at least one probe and at least one contact pad for a plurality of probe overdrive positions, and determining a relationship between contact force and probe overdrive position from the measured contact forces; determining a first region in the relationship exhibiting a non-linear dependence of the contact force from the probe overdrive position, and a second region exhibiting a linear dependence of the contact force from the probe overdrive position; and determining a process window for a pad probing process based on the determined first region and second region.
Public/Granted literature
- US20160356844A1 PROBE-PAD QUALIFICATION Public/Granted day:2016-12-08
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