A scan driver includes scan-driving blocks, each including a first transistor having a gate coupled to a first node to supply a first power to an output terminal, a second transistor having a gate coupled to a second node to couple a second clock to the output terminal, a third transistor having a gate coupled to a first input to supply the first power to the first node, a fourth transistor having a gate coupled to a second input to supply a second power to the first node, and a fifth transistor having a gate coupled to a first clock to couple the first input to the second node. A first scan-driving block further includes a sixth transistor coupled between the second input and the fourth transistor gate, and a NOT gate configured to invert the first input signal and to supply the inverted signal to the sixth transistor gate.