- 专利标题: Ophthalmic examination system
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申请号: US15334817申请日: 2016-10-26
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公开(公告)号: US09888847B2公开(公告)日: 2018-02-13
- 发明人: Tomohiro Sakurada , Yukio Ikezawa
- 申请人: TOPCON CORPORATION
- 申请人地址: JP Itabashi-ku
- 专利权人: TOPCON CORPORATION
- 当前专利权人: TOPCON CORPORATION
- 当前专利权人地址: JP Itabashi-ku
- 代理机构: Oblon, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2015-220677 20151110
- 主分类号: A61B3/02
- IPC分类号: A61B3/02 ; A61B3/00 ; A61B3/18 ; A61B90/00 ; A61B3/028 ; A61B5/00
摘要:
According to an ophthalmic examination system of an embodiment, a user interface of an examination instruction apparatus is used to enter an instruction for examination. A first communication unit sends the instruction to an ophthalmic examination apparatus in real time. An examination optical system of the ophthalmic examination apparatus includes an optical element applied to an eye and a projection system that projects an examination light beam onto the eye through the optical element. An information presentation optical system includes a display and a light guide system that guides a display light beam from the display to the eye through the optical element. A second communication unit receives the instruction from the examination instruction apparatus. A controller displays the instruction received by the second communication unit on the display in real time.
公开/授权文献
- US20170127942A1 OPHTHALMIC EXAMINATION SYSTEM 公开/授权日:2017-05-11
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