Invention Grant
- Patent Title: Methods and apparatus for thermal testing of antennas
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Application No.: US14801159Application Date: 2015-07-16
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Publication No.: US09891258B2Publication Date: 2018-02-13
- Inventor: Roger C. Esplin , Heath A. Strickland
- Applicant: RAYTHEON COMPANY
- Applicant Address: US MA Waltham
- Assignee: Raytheon Company
- Current Assignee: Raytheon Company
- Current Assignee Address: US MA Waltham
- Agency: Daly, Crowley, Mofford & Durkee, LLP
- Main IPC: G01R29/10
- IPC: G01R29/10 ; G01R31/00

Abstract:
Methods and apparatus for thermal testing of an antenna. Embodiments enable positioning a unit under test having an antenna in an anechoic chamber and, manipulating a RF transparent heat chamber over the antenna. A system can raise a temperature in the heat chamber to a selected temperature and obtain antenna performance information while the antenna is heated in the heat chamber. Temperature affects on antenna performance can be determined.
Public/Granted literature
- US20170016944A1 Methods and Apparatus for Thermal Testing of Antennas Public/Granted day:2017-01-19
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