Invention Grant
- Patent Title: Alignment mark for semiconductor device
-
Application No.: US14712382Application Date: 2015-05-14
-
Publication No.: US09893018B2Publication Date: 2018-02-13
- Inventor: Yeong-Kwon Ko , Tae-Hyeong Kim , Ji-Hwang Kim , Sun-Kyoung Seo , Tae-Je Cho
- Applicant: Yeong-Kwon Ko , Tae-Hyeong Kim , Ji-Hwang Kim , Sun-Kyoung Seo , Tae-Je Cho
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2014-0108496 20140820
- Main IPC: H01L23/544
- IPC: H01L23/544 ; H01L25/065 ; B23K26/00 ; H01L21/768

Abstract:
Semiconductor devices and methods for manufacturing a semiconductor device include a first semiconductor substrate in which a first scribe line region and a first chip region are defined, a first alignment mark inside the first semiconductor substrate and in the first scribe line region so as to be spaced apart from an upper side of the first semiconductor substrate, a second semiconductor substrate on the first semiconductor substrate and in which a second scribe line region and a second chip region are defined, and a second alignment mark inside the second semiconductor substrate and in the second scribe line region so as to be spaced apart from an upper side of the second semiconductor substrate, wherein the second semiconductor substrate is on the first semiconductor substrate so that positions of the first alignment mark and the second alignment mark correspond to each other.
Public/Granted literature
- US20160056113A1 SEMICONDUCTOR DEVICES AND METHODS FOR MANUFACTURING THE SAME Public/Granted day:2016-02-25
Information query
IPC分类: