Invention Grant
- Patent Title: Testing probe and testing apparatus for ensuring good contact between testing probe and surface of test sample
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Application No.: US15137849Application Date: 2016-04-25
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Publication No.: US09903886B2Publication Date: 2018-02-27
- Inventor: Jing Wang , Jianyang Yu
- Applicant: BOE Technology Group Co., Ltd. , Hefei BOE Optoelectronics Technology Co., Ltd.
- Applicant Address: CN Beijing CN Hefei
- Assignee: BOE Technology Group Co., Ltd.,Hefei BOE Optoelectronics Technology Co., Ltd.
- Current Assignee: BOE Technology Group Co., Ltd.,Hefei BOE Optoelectronics Technology Co., Ltd.
- Current Assignee Address: CN Beijing CN Hefei
- Agency: Banner & Witcoff, Ltd.
- Priority: CN201510306976 20150604
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R1/067 ; G09G3/00 ; G02F1/1362

Abstract:
A testing probe and a testing apparatus are disclosed. The testing probe including: a housing, including a test end and a fixed end, and with a test opening at the test end; a piston, being capable of sliding between the test end and the fixed end along an inner wall of the housing, and a conductive adhesive agent chamber being formed by the piston and the fixed end of the housing and being configured to be filled with a conductive adhesive agent; and the conductive adhesive agent being allowed to overflow from a gap between the piston and the inner wall of the housing by squeezing the piston; an elastic member with a first end fixed to the piston and a second end extending toward the test end; a sphere being disposed at the test opening and separated from the second end of the elastic member by a preset distance.
Public/Granted literature
- US20160356815A1 Testing Probe and Testing Apparatus Public/Granted day:2016-12-08
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