Invention Grant
- Patent Title: Transistor and method of forming same
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Application No.: US14957866Application Date: 2015-12-03
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Publication No.: US09911849B2Publication Date: 2018-03-06
- Inventor: Veeraraghavan S. Basker , Nicolas L. Breil , Oleg Gluschenkov , Shogo Mochizuki , Alexander Reznicek
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Hoffman Warnick LLC
- Agent Steven J. Meyers
- Main IPC: H01L21/336
- IPC: H01L21/336 ; H01L21/8234 ; H01L29/78 ; H01L21/8238 ; H01L27/092 ; H01L29/201 ; H01L29/205 ; H01L29/207

Abstract:
A first aspect of the invention provides for a transistor. The transistor may include a gate stack on a substrate; a channel under the gate stack within the substrate; a doped source and a doped drain on opposing sides of the channel, the doped source and the doped drain each including a dopant, wherein the dopant and the channel together have a first coefficient of diffusion and the doped source and the doped drain each have a second coefficient of diffusion; and a doped extension layer substantially separating each of the doped source and the doped drain from the channel, the doped extension layer having a third coefficient of diffusion, wherein the third coefficient of diffusion is greater than the first coefficient of diffusion.
Public/Granted literature
- US20170162694A1 TRANSISTOR AND METHOD OF FORMING SAME Public/Granted day:2017-06-08
Information query
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