Invention Grant
- Patent Title: Surface property measuring apparatus and method for controlling the same
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Application No.: US14264416Application Date: 2014-04-29
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Publication No.: US09921044B2Publication Date: 2018-03-20
- Inventor: Tatsuki Nakayama
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kawasaki-Shi
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kawasaki-Shi
- Agency: Rankin, Hill & Clark LLP
- Priority: JP2013-096517 20130501
- Main IPC: G01B5/28
- IPC: G01B5/28 ; G01B21/04 ; G01B3/00 ; G01B5/20

Abstract:
A surface property measuring apparatus includes a control unit, configured to control operations of a roughness measuring instrument and a relative moving mechanism, including: a measuring force command module configured to output a measuring command; and a measuring force control module configured to control the direction and magnitude of the measuring force, wherein the measuring force control module instructs a measuring force application unit of the roughness measuring instrument to generate therein the measuring force whose magnitude and direction are designated by the measuring force command when a displacement speed of a measuring arm is equal to or slower than a predetermined threshold, and the measuring force control module instructs the measuring force application unit to generate therein a force in a direction in which the distal end of the measuring arm is raised upwards when the displacement speed of the measuring arm exceeds the predetermined threshold.
Public/Granted literature
- US20140326057A1 SURFACE PROPERTY MEASURING APPARATUS AND METHOD FOR CONTROLLING THE SAME Public/Granted day:2014-11-06
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