- Patent Title: System, method and computer program product for detecting defects in a fabricated target component using consistent modulation for the target and reference components
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Application No.: US15194436Application Date: 2016-06-27
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Publication No.: US09940705B2Publication Date: 2018-04-10
- Inventor: Allen Park , Martin Plihal
- Applicant: KLA-Tencor Corporation
- Applicant Address: TW Milpitas
- Assignee: KLA-Tencor Corporation
- Current Assignee: KLA-Tencor Corporation
- Current Assignee Address: TW Milpitas
- Agency: Zilka-Kotab, PC
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00

Abstract:
A fabricated device having consistent modulation between target and reference components is provided. The fabricated device includes a target component having a first modulation. The fabricated device further includes at least two reference components for the target component including a first reference component and a second reference component, where the first reference component and the second reference component each have the first modulation. Further, a system, method, and computer program product are provided for detecting defects in a fabricated target component using consistent modulation for the target and reference components.
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