Invention Grant
- Patent Title: IC structure integrity sensor having interdigitated conductive elements
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Application No.: US15237066Application Date: 2016-08-15
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Publication No.: US09947602B2Publication Date: 2018-04-17
- Inventor: Zhuojie Wu , Erdem Kaltalioglu
- Applicant: GLOBALFOUNDRIES Inc.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES INC.
- Current Assignee: GLOBALFOUNDRIES INC.
- Current Assignee Address: KY Grand Cayman
- Agency: Hoffman Warnick LLC
- Agent Yuanmin Cai
- Main IPC: H01L21/66
- IPC: H01L21/66

Abstract:
A sensor for an integrated circuit (IC) structure is disclosed. The sensor includes a sensor layer in a layer of the IC structure, the sensor layer including: a first conductive structure disposed proximate a perimeter of the IC structure; and a second conductive structure disposed parallel to the first conductive structure and proximate the perimeter of the IC structure. The sensor also includes a set of interdigitating conductive elements including a first plurality of conductive elements electrically coupled to the first conductive structure interdigitating with a second plurality of conductive elements electrically coupled to the second conductive structure.
Public/Granted literature
- US20180047648A1 IC STRUCTURE INTEGRITY SENSOR HAVING INTERDIGITATED CONDUCTIVE ELEMENTS Public/Granted day:2018-02-15
Information query
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