- 专利标题: Fin field-effect transistor gated diode
-
申请号: US15122379申请日: 2015-05-25
-
公开(公告)号: US09947659B2公开(公告)日: 2018-04-17
- 发明人: Chang-Tzu Wang , Bo-Shih Huang
- 申请人: MediaTek Inc.
- 申请人地址: TW Hsin-Chu
- 专利权人: MEDIATEK INC.
- 当前专利权人: MEDIATEK INC.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: McClure, Qualey & Rodack, LLP
- 国际申请: PCT/CN2015/079658 WO 20150525
- 国际公布: WO2015/180595 WO 20151203
- 主分类号: H01L27/02
- IPC分类号: H01L27/02 ; H01L27/088 ; H01L29/78 ; H01L23/535
摘要:
The invention provides a semiconductor device. The semiconductor device includes a fin field effect transistor (finFET) array including finFET units. Each of the finFET units includes a substrate having a fin along a first direction. A first metal strip pattern and a second metal strip pattern are formed on the fin, extending along a second direction that is different from the first direction. The first and second metal strip patterns are conformally formed on opposite sidewalls and a top surface of the fin, respectively. A first contact and a second contact are formed on the fin. The first and second metal strip patterns are disposed between the first and second contacts. A first dummy contact is formed on the fin, sandwiched between the first and second metal strip patterns.
公开/授权文献
- US20160372468A1 FIN FIELD-EFFECT TRANSISTOR GATED DIODE 公开/授权日:2016-12-22
信息查询
IPC分类: