- 专利标题: Apparatus and method for evaluation of optical elements
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申请号: US15154454申请日: 2016-05-13
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公开(公告)号: US09958355B2公开(公告)日: 2018-05-01
- 发明人: Filipp V. Ignatovich , Donald S. Gibson , Michael A. Marcus
- 申请人: LUMETRICS, INC.
- 申请人地址: US NY Rochester
- 专利权人: Lumetrics, Inc.
- 当前专利权人: Lumetrics, Inc.
- 当前专利权人地址: US NY Rochester
- 代理机构: Patent Innovations LLC
- 代理商 John M. Hammond
- 主分类号: G01B9/00
- IPC分类号: G01B9/00 ; G01M11/02
摘要:
An apparatus for measuring the optical performance characteristics and dimensions of an optical element comprising a low coherence interferometer and a Shack-Hartmann wavefront sensor comprising a light source, a plurality of lenslets, and a sensor array is disclosed. The low coherence interferometer is configured to direct a measurement beam along a central axis of the optical element, and to measure the thickness of the center of the optical element. The light source of the Shack-Hartmann wavefront sensor is configured to emit a waveform directed parallel to and surrounding the measurement beam of the interferometer, through the plurality of lenslets, and to the sensor array. A method for measuring the optical performance characteristics and dimensions of a lens using the apparatus is also disclosed.
公开/授权文献
- US20160252425A1 APPARATUS AND METHOD FOR EVALUATION OF OPTICAL ELEMENTS 公开/授权日:2016-09-01
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