Invention Grant
- Patent Title: Methods for monitoring strain and temperature in a hot gas path component
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Application No.: US14504961Application Date: 2014-10-02
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Publication No.: US09964455B2Publication Date: 2018-05-08
- Inventor: Mark Allen Cheverton , Anant Achyut Setlur , Victor Petrovich Ostroverkhov , Guanghua Wang , James Anthony Brewer , Venkat Subramaniam Venkataramani
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: GE Global Patent Operation
- Main IPC: G01J5/00
- IPC: G01J5/00 ; G01L1/24 ; G01K1/14 ; G01K11/20

Abstract:
A method of monitoring a surface temperature of a hot gas path component includes directing an excitation beam having an excitation wavelength at a layer of a sensor material composition deposited on a hot gas path component to induce a fluorescent radiation. The method includes measuring fluorescent radiation emitted by the sensor material composition. The fluorescent radiation includes at least a first intensity at a first wavelength and a second intensity at a second wavelength. The surface temperature of the hot gas path component is determined based on a ratio of the first intensity at the first wavelength and the second intensity at the second wavelength of the fluorescent radiation emitted by the sensor material composition.
Public/Granted literature
- US20160153842A1 METHODS FOR MONITORING STRAIN AND TEMPERATURE IN A HOT GAS PATH COMPONENT Public/Granted day:2016-06-02
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