Invention Grant
- Patent Title: Apparatus for analyzing active material of secondary battery and method of analyzing active material using the same
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Application No.: US14734229Application Date: 2015-06-09
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Publication No.: US09970906B2Publication Date: 2018-05-15
- Inventor: Jooho Lee , Changseung Lee , Jeoyoung Shim , Sunghee Lee , Woosung Jeon
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2014-0109046 20140821
- Main IPC: G01N29/12
- IPC: G01N29/12 ; G01N29/24

Abstract:
An apparatus for analyzing an active material of a secondary battery may include: a first electrode; a piezoelectric layer on the first electrode; a second electrode on the piezoelectric layer, configured to provide a voltage having a polarity opposite to a polarity of the first electrode; and/or an insulating layer on the second electrode and including a through hole exposing a portion of the second electrode. A method of analyzing an active material of a secondary battery may include: disposing an active material in a through hole of a bulk acoustic resonator, in which a first electrode, a piezoelectric layer, a second electrode, and an insulating layer are stacked; measuring a resonance frequency of the resonator by applying an electric signal to the first and second electrodes of the resonator; and/or measuring a weight of the active material in the through hole, based on the measured resonance frequency.
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