- 专利标题： Method and device for measuring features on or near an object
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申请号： US15018628申请日： 2016-02-08
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公开(公告)号： US09984474B2公开(公告)日： 2018-05-29
- 发明人: Clark Alexander Bendall
- 申请人： General Electric Company
- 代理机构： Mintz Levin Cohn Ferris Glovsky and Popeo, P.C.
- 主分类号： G01R33/12
- IPC分类号： G01R33/12 ; G06T7/60 ; G01B11/24 ; G06T19/00 ; G06F3/00 ; G06F3/0484 ; G06T7/00 ; G06T7/62
摘要：
A method and device for measuring dimensions of a feature on or near an object using a video inspection device. A reference surface is determined based on reference surface points on the surface of the object. One or more measurement cursors are placed on measurement pixels of an image of the object. Projected reference surface points associated with the measurement pixels on the reference surface are determined. The dimensions of the feature can be determined using the three-dimensional coordinates of at least one of the projected reference surface points.