Invention Grant
- Patent Title: Metal layer tip to tip short
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Application No.: US15422923Application Date: 2017-02-02
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Publication No.: US09997403B2Publication Date: 2018-06-12
- Inventor: Cheng Chi , Ruilong Xie
- Applicant: International Business Machines Corporation , GlobalFoundries, Inc.
- Applicant Address: US NY Armonk KY Grand Cayman
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION,GLOBALFOUNDRIES, INC.
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION,GLOBALFOUNDRIES, INC.
- Current Assignee Address: US NY Armonk KY Grand Cayman
- Agency: Cantor Colburn LLP
- Main IPC: H01L27/088
- IPC: H01L27/088 ; H01L21/768 ; H01L29/06 ; H01L29/51 ; H01L29/45

Abstract:
Techniques relate to forming an integrated circuit. Trench contacts are formed on top of at least one source and drain of an intermediate structure. An interlayer dielectric is formed on top of the intermediate structure. A trench is cut through the interlayer dielectric, through at least one of the trench contacts, down to a shallow trench isolation area. The trench is filled with a filling material. Upper contacts are formed on top of the trench contacts in the interlayer dielectric. A first metal layer pattern is patterned such that a separation is formed by a filling material width of the filling material. First metal layers are formed according to the first metal layer pattern, where tips of the first metal layers are aligned to the filling material that fills the trench, such that the tips of the first metal layers are separated by the filling material width.
Public/Granted literature
- US20170243784A1 METAL LAYER TIP TO TIP SHORT Public/Granted day:2017-08-24
Information query
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