- 专利标题： Contact pin for integrated circuit testing
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申请号： US29843097申请日： 2022-06-17
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公开(公告)号： USD1042346S1公开(公告)日： 2024-09-17
- 设计人: Melissa Hasskamp , David Skodje , Mike Andres
- 申请人： Johnstech International Corporation
- 申请人地址： US MN Minneapolis
- 专利权人： Johnstech International Corporation
- 当前专利权人： Johnstech International Corporation
- 当前专利权人地址： US MN Minneapolis
- 代理机构： HSML P.C.
- LOC分类号： 13-03
摘要：
FIG. 1 is a top front perspective view of a contact pin for integrated circuit testing showing our new design;
FIG. 2 is a bottom rear perspective view thereof;
FIG. 3 is a front elevation view thereof;
FIG. 4 is a rear elevation view thereof;
FIG. 5 is a left side elevation view thereof;
FIG. 6 is a right side elevation view thereof;
FIG. 7 is a top plan view thereof; and,
FIG. 8 is a bottom plan view thereof.
FIG. 2 is a bottom rear perspective view thereof;
FIG. 3 is a front elevation view thereof;
FIG. 4 is a rear elevation view thereof;
FIG. 5 is a left side elevation view thereof;
FIG. 6 is a right side elevation view thereof;
FIG. 7 is a top plan view thereof; and,
FIG. 8 is a bottom plan view thereof.
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