再颁专利
- 专利标题: Coating thickness gauge
- 专利标题(中): 涂层厚度计
-
申请号: US09542640申请日: 2000-04-03
-
公开(公告)号: USRE41342E1公开(公告)日: 2010-05-18
- 发明人: Frank J. Koch , Leon C. Vandervalk , David J. Beamish
- 申请人: Frank J. Koch , Leon C. Vandervalk , David J. Beamish
- 申请人地址: US NY Ogdensburg
- 专利权人: DeFelsko Corporation
- 当前专利权人: DeFelsko Corporation
- 当前专利权人地址: US NY Ogdensburg
- 代理机构: Buchanan Ingersoll & Rooney PC
- 主分类号: G01N23/203
- IPC分类号: G01N23/203
摘要:
A modular coating thickness gauge includes a probe which generates a signal representative of coating thickness, a PCMCIA card connected to the probe for converting the signal into a standard PCMCIA output format, and a portable computing unit for receiving the signal via the PCMCIA card. The gauge allows the on-site user to alternately record coating thickness measurement data and descriptive textual or graphical data relating to each coating thickness measurement.
信息查询