Invention Application
- Patent Title: INTERFEROMETRIC METHOD AND DEVICE FOR CHARACTERISING A MEDIUM
- Patent Title (中): 用于表征介质的干涉方法和装置
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Application No.: PCT/FR1996002045Application Date: 1996-12-20
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Publication No.: WO1997024019A1Publication Date: 1997-07-03
- Inventor: COMMISSARIAT A L'ENERGIE ATOMIQUE
- Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE , ELOY, Jean-François
- Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE,ELOY, Jean-François
- Current Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE,ELOY, Jean-François
- Priority: FR95/15393 19951222
- Main IPC: H05H01/00
- IPC: H05H01/00
Abstract:
An interferometric device for characterising a medium (24), comprising means (2, 6, 8, 12, 14) for generating a radiation pulse train at a repetition rate higher than 10 Hz, means for aiming a pump beam (28) at the medium to be measured which responds by producing a signal beam (32), sensing means (26) for receiving the signal beam, means (14) for aiming a probe beam (30) at the sensing means (26), means (34) for sampling an incident signal on the sensor (26) resulting from the interference between the signal beam (32) from the medium and the probe beam (30), and means (44-1, 44-2, ...) for varying the time at which the sampling means are actuated.
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