An apparatus (10) makes easier, simpler and quicker the obtention of a sample of solid materials for physical and/or chemical testing. The apparatus (10) comprises a housing (24) containing a ram (18), the housing (24) having an anvil end (22) and a cutting end (12). In a method of using the apparatus (10), the cutting end (12) is driven into a substrate (14) and a plug (16) of sample material is obtained. Plug (16) is removed from housing (24) by forcing ram (18) in the direction of plug (16).