Invention Application
WO00071968A1 DEVICE AND METHOD FOR OPTICAL PATH LENGTH MEASUREMENT 审中-公开
光路长度测量装置及方法

  • Patent Title: DEVICE AND METHOD FOR OPTICAL PATH LENGTH MEASUREMENT
  • Patent Title (中): 光路长度测量装置及方法
  • Application No.: PCT/US2000/014075
    Application Date: 2000-05-23
  • Publication No.: WO00071968A1
    Publication Date: 2000-11-30
  • Main IPC: G01B9/02
  • IPC: G01B9/02 G01S7/483 G01S7/491 G01S17/08 G01S17/10 G01S17/32
DEVICE AND METHOD FOR OPTICAL PATH LENGTH MEASUREMENT
Abstract:
This invention is a device and method for the measurement of optical path length. A frequency chirped electromagnetic wave source, such as a laser beam, is split into two branches. A reference branch is projected directly onto a photosensor, while a probe branch is launched towards a target whose distance relative to the reference path is to be determined. A reflected wave from the target is collected and mixed with the reference onto a photosensor. Due to the unequal path lengths traveled by the reference and the reflected probe laser beams as well as the chirped nature of their frequencies, a certain optical frequency difference exists between the two beams. This frequency difference is linearly proportional to the relative optical path length difference between the two laser beams and the relative optical path length can be readily determined by using a photosensor that generates photocurrents linearly proportional to the relative optical frequency differences between the reference and reflected branches.
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