Invention Application
- Patent Title: METHOD AND APPARATUS FOR IN-CIRCUIT IMPEDANCE MEASUREMENT
- Patent Title (中): 电路阻抗测量的方法和装置
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Application No.: PCT/US2002/040424Application Date: 2002-12-17
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Publication No.: WO2003052429A2Publication Date: 2003-06-26
- Inventor: DAVIS, Larry, J. , COX, Kenneth, M.
- Applicant: SIGNUS, INC.
- Applicant Address: 1608 East 350 South, Springville, UT 84663 US
- Assignee: SIGNUS, INC.
- Current Assignee: SIGNUS, INC.
- Current Assignee Address: 1608 East 350 South, Springville, UT 84663 US
- Agency: HOBSON, Garron, M.
- Priority: US10/024,587 20011217
- Main IPC: G01R
- IPC: G01R
Abstract:
A device (10) for measuring an impedance (Z 2 ) between first and second nodes (22, 24) in an electrical circuit (18) without removing components includes at least one current source (62 and/or 66) to provide first and second currents or current signals (i 0 , i 1 ) of known values. First and second probes (30, 34) contact the respective first and second nodes to apply the first and second currents. A third common probe (46) contacts the circuit at a common node (50) that experiences the same current flow as between the first and second nodes. At least one voltage meter (70 and/or 74) measures voltages (V 00 , V 01 , V 11 and V 10 ) corresponding to the first and second currents. A processor (100) calculates the impedance based on the known values of the currents, and the measured values of the voltages.
Public/Granted literature
- WO2003052429A3 METHOD AND APPARATUS FOR IN-CIRCUIT IMPEDANCE MEASUREMENT Public/Granted day:2003-06-26
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