Invention Application
- Patent Title: METHOD AND APPARATUS FOR IN-CIRCUIT IMPEDANCE MEASUREMENT
- Patent Title (中): 电路阻抗测量的方法和装置
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Application No.: PCT/US0240424Application Date: 2002-12-17
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Publication No.: WO03052429A9Publication Date: 2004-03-25
- Inventor: DAVIS LARRY J , COX KENNETH M
- Applicant: SIGNUS INC
- Assignee: SIGNUS INC
- Current Assignee: SIGNUS INC
- Priority: US2458701 2001-12-17
- Main IPC: G01R27/02
- IPC: G01R27/02 ; G01R27/16 ; G01R31/27 ; G01R31/28 ; G01R27/08
Abstract:
A device (10) for measuring an impedance (Z2) between first and second nodes (22, 24) in an electrical circuit (18) without removing components includes at least one current source (62 and/or 66) to provide first and second currents or current signals (i0, i1) of known values. First and second probes (30, 34) contact the respective first and second nodes to apply the first and second currents. A third common probe (46) contacts the circuit at a common node (50) that experiences the same current flow as between the first and second nodes. At least one voltage meter (70 and/or 74) measures voltages (V00, V01, V11 and V10) corresponding to the first and second currents. A processor (100) calculates the impedance based on the known values of the currents, and the measured values of the voltages.
Information query