Invention Application
- Patent Title: HIGH TEMPERATURE IMAGING DEVICE
- Patent Title (中): 高温成像装置
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Application No.: PCT/US2004038706Application Date: 2004-11-18
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Publication No.: WO2005050257A8Publication Date: 2005-08-11
- Inventor: SCHULTZ ROGER L , FREEMAN JAMES J , SKINNER NEAL G , STREICH STEVEN G
- Applicant: HALLIBURTON ENERGY SERV INC , SCHULTZ ROGER L , FREEMAN JAMES J , SKINNER NEAL G , STREICH STEVEN G
- Assignee: HALLIBURTON ENERGY SERV INC,SCHULTZ ROGER L,FREEMAN JAMES J,SKINNER NEAL G,STREICH STEVEN G
- Current Assignee: HALLIBURTON ENERGY SERV INC,SCHULTZ ROGER L,FREEMAN JAMES J,SKINNER NEAL G,STREICH STEVEN G
- Priority: US52095003 2003-11-18; US52099203 2003-11-18
- Main IPC: B81B7/00
- IPC: B81B7/00 ; E21B20060101 ; E21B7/00 ; E21B45/00 ; G01V20060101 ; G01V3/08 ; H01L20060101 ; H01L21/86 ; H01L23/02 ; H01L27/12 ; H01Q20060101 ; G01V

Abstract:
High temperature imaging devices are disclosed. In one embodiment, the imaging device comprises an array of photosensitive elements fabricated on an insulator substrate, and an information storage component coupled to the array. The information storage component stores data representing one or more light patterns detected by the array. The light patterns may be images or spectral patterns. The insulator substrate may be a sapphire or spinel substrate. Alternatively, the substrate may be silicon carbide or an insulated silicon substrate. In at least some embodiments, a processor is integrated on the same substrate as the array.
Public/Granted literature
- WO2005050257A3 HIGH TEMPERATURE IMAGING DEVICE Public/Granted day:2009-04-16
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