Invention Application
WO2005084872A1 ULTRAFAST LASER DIRECT WRITING METHOD FOR MODIFYING EXISTING MICROSTRUCTURES ON A SUBMICRON SCALE
审中-公开
超声波激光直接写入方法,用于修改现有的微观尺度
- Patent Title: ULTRAFAST LASER DIRECT WRITING METHOD FOR MODIFYING EXISTING MICROSTRUCTURES ON A SUBMICRON SCALE
- Patent Title (中): 超声波激光直接写入方法,用于修改现有的微观尺度
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Application No.: PCT/US2005/006217Application Date: 2005-02-25
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Publication No.: WO2005084872A1Publication Date: 2005-09-15
- Inventor: LI, Ming , ISHIZUKA, Makoto
- Applicant: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. , LI, Ming , ISHIZUKA, Makoto
- Applicant Address: 1006, Ohaza Kadoma, Kadoma-shi, Osaka 571-8501 JP
- Assignee: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.,LI, Ming,ISHIZUKA, Makoto
- Current Assignee: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.,LI, Ming,ISHIZUKA, Makoto
- Current Assignee Address: 1006, Ohaza Kadoma, Kadoma-shi, Osaka 571-8501 JP
- Agency: NIGON, Kenneth N.
- Priority: US10/790,401 20040301
- Main IPC: B23K26/04
- IPC: B23K26/04
Abstract:
A method for pre-calibration of a laser micro-machining system to achieve alignment tolerances greater than the diffraction limit of an illumination wavelength. A blank is mounted in the system, such that the beam spot is incident on its top surface. Two marks are ablated in the blank. The centers of the marks are a predetermined distance apart. The blank is illuminated with light and imaged with a digital camera. The resulting image is scaled such that each pixel has a width corresponding to a distance on the imaged surface, which is less than half of the illumination wavelength. The number of pixels between the centers of the marks determines this distance. The locations of the marks in the image are determined and a coordinate system is defined for surfaces imaged by the digital camera. Coordinates of the beam spot in this coordinate system are also determined using the second mark.
Information query
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