Invention Application
WO2005086630A2 REDUCED COMPLEXITY TRANSMISSION LINE AND WAVEGUIDE FAULT TESTER
审中-公开
降低复杂的传输线和波导故障测试仪
- Patent Title: REDUCED COMPLEXITY TRANSMISSION LINE AND WAVEGUIDE FAULT TESTER
- Patent Title (中): 降低复杂的传输线和波导故障测试仪
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Application No.: PCT/US2005/001337Application Date: 2005-01-13
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Publication No.: WO2005086630A2Publication Date: 2005-09-22
- Inventor: NIEDZWIECKI, Joshua, D.
- Applicant: BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC. , NIEDZWIECKI, Joshua, D.
- Applicant Address: 65 Spit Brook Road, NHQ01-719, Nashua, NH 03060 US
- Assignee: BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC.,NIEDZWIECKI, Joshua, D.
- Current Assignee: BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC.,NIEDZWIECKI, Joshua, D.
- Current Assignee Address: 65 Spit Brook Road, NHQ01-719, Nashua, NH 03060 US
- Agency: LONG, Daniel, J.
- Priority: US60/536,977 20040115; US60/536,886 20040115
- Main IPC: G01N33/48
- IPC: G01N33/48 ; G01N33/50 ; G01R23/16 ; G01R27/04 ; G01R27/32 ; G01R35/00 ; G06F19/00 ; H04B3/46 ; H04B3/56
Abstract:
A four-port junction is substituted for a six-port junction in a frequency domain reflectometer, which reduces the parts count and therefore cost and size of the reflectometer while improving reliability. The frequency domain reflectometer can alternatively be used as an insertion loss tester. An algorithm including the Hilbert Transform is used to directly calculate the estimated reflection coefficient from the output power measured at only two output ports.
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