Invention Application
- Patent Title: ION TRAP MASS ANALYZER
- Patent Title (中): 离子质谱分析仪
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Application No.: PCT/CA2005/000866Application Date: 2005-06-03
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Publication No.: WO2005119737A1Publication Date: 2005-12-15
- Inventor: DING, Chuan-Fan
- Applicant: FUDAN UNIVERSITY , DING, Chuan-Fan
- Applicant Address: 220 Handan Road, Department of Chemistry, Shanghai 200433 CN
- Assignee: FUDAN UNIVERSITY,DING, Chuan-Fan
- Current Assignee: FUDAN UNIVERSITY,DING, Chuan-Fan
- Current Assignee Address: 220 Handan Road, Department of Chemistry, Shanghai 200433 CN
- Agency: CAMERON, Norman M.
- Priority: CN200410024946.8 20040604
- Main IPC: H01J49/26
- IPC: H01J49/26
Abstract:
An ion trap mass analyzer includes an elongated tunnel that has a wall, a longitudinal axis and an inner space. The wall includes a substrate and conductor trace patterns. There is also a variable electric potential means for providing electric potentials which is connected to the conductor trace patterns. The conductor trace patterns and the variable electric potential means provide a variable electric field within the inner space of the tunnel for transferring, storing, and analyzing ions.
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