Invention Application
- Patent Title: AUTONOMOUS CALIBRATION FOR OPTICAL ANALYSIS SYSTEM
- Patent Title (中): 光学分析系统的自动校准
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Application No.: PCT/IB2005/052558Application Date: 2005-07-29
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Publication No.: WO2006021903A1Publication Date: 2006-03-02
- Inventor: SCHUURMANS, Franck, Jeroen, Pieter , VAN BEEK, Michael, Cornelis , VAN DER VOORT, Marjolein
- Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V. , SCHUURMANS, Franck, Jeroen, Pieter , VAN BEEK, Michael, Cornelis , VAN DER VOORT, Marjolein
- Applicant Address: Groenewoudseweg 1, NL-5621 BA Eindhoven NL
- Assignee: KONINKLIJKE PHILIPS ELECTRONICS N.V.,SCHUURMANS, Franck, Jeroen, Pieter,VAN BEEK, Michael, Cornelis,VAN DER VOORT, Marjolein
- Current Assignee: KONINKLIJKE PHILIPS ELECTRONICS N.V.,SCHUURMANS, Franck, Jeroen, Pieter,VAN BEEK, Michael, Cornelis,VAN DER VOORT, Marjolein
- Current Assignee Address: Groenewoudseweg 1, NL-5621 BA Eindhoven NL
- Agency: CHAFFRAIX, Jean
- Priority: EP04104085.8 20040826
- Main IPC: G01J3/36
- IPC: G01J3/36 ; G01J3/04
Abstract:
The present invention provides an autonomous calibration of a multivariate based spectroscopic system that is preferably implemented as a multivariate based spectrometer. The spectroscopic system is based on a multivariate optical element that provides a spectral weighting of an incident optical signal. Spectral weighting is performed on the basis of spatial separation of spectral components and subsequent spatial filtering by means of a spatial light modulator. Calibration of the spectroscopic system is based on a dedicated calibration segment of the spatial light modulator, whose position corresponds to a characteristic calibration or reference wavelength of the incident optical signal. Preferably, the calibration or reference wavelength is given by the wavelength of the excitation radiation generated by the optical source that serves to induce scattering processes in a volume of interest.
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