Invention Application
- Patent Title: METHOD OF ON-LINE THICKNESS MEASUREMENT OF APPLIED COATINGS
- Patent Title (中): 应用涂层的在线厚度测量方法
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Application No.: PCT/CA2006/000553Application Date: 2006-04-12
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Publication No.: WO2006116841A1Publication Date: 2006-11-09
- Inventor: MOREAU, Christian , LAMONTAGNE, Mario , NADEAU, François , BLAIN, Jacques , POULIOT, Luc , NADEAU, Alexandre , BERUBE, Simon, Alex
- Applicant: NATIONAL RESEARCH COUNCIL OF CANADA , MOREAU, Christian , LAMONTAGNE, Mario , NADEAU, François , BLAIN, Jacques , POULIOT, Luc , NADEAU, Alexandre , BERUBE, Simon, Alex
- Applicant Address: Intellectual Property Service Office, Montreal Road, Bldg. M58-EG12, Ottawa, Ontario K1A 0R6 CA
- Assignee: NATIONAL RESEARCH COUNCIL OF CANADA,MOREAU, Christian,LAMONTAGNE, Mario,NADEAU, François,BLAIN, Jacques,POULIOT, Luc,NADEAU, Alexandre,BERUBE, Simon, Alex
- Current Assignee: NATIONAL RESEARCH COUNCIL OF CANADA,MOREAU, Christian,LAMONTAGNE, Mario,NADEAU, François,BLAIN, Jacques,POULIOT, Luc,NADEAU, Alexandre,BERUBE, Simon, Alex
- Current Assignee Address: Intellectual Property Service Office, Montreal Road, Bldg. M58-EG12, Ottawa, Ontario K1A 0R6 CA
- Agency: MITCHELL, Richard, J. et al.
- Priority: US60/675,919 20050429
- Main IPC: G01B21/08
- IPC: G01B21/08 ; G01B11/06 ; C23C4/00
Abstract:
In a method of measuring the thickness of a coating as it is applied to a substrate, wherein the coating is applied as a thin ribbon from a spray gun, at least one surface profile of the applied coating is obtained along a line intersecting the ribbon during relative movement of the substrate and spray gun. The thickness of the applied coating is computed from the obtained surface profile.
Information query
