Invention Application
- Patent Title: SYSTEMS AND METHODS FOR ANALYZING NANOREPORTERS
- Patent Title (中): 用于分析纳米载体的系统和方法
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Application No.: PCT/US2007/012130Application Date: 2007-05-21
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Publication No.: WO2007139766A2Publication Date: 2007-12-06
- Inventor: HWANG, Jenq-Neng , MITTON, Jeffrey, D.
- Applicant: NANOSTRING TECHNOLOGIES, INC. , HWANG, Jenq-Neng , MITTON, Jeffrey, D.
- Applicant Address: 210 Elliot Avenue West, Suite 300 Seattle, WA 98119 US
- Assignee: NANOSTRING TECHNOLOGIES, INC.,HWANG, Jenq-Neng,MITTON, Jeffrey, D.
- Current Assignee: NANOSTRING TECHNOLOGIES, INC.,HWANG, Jenq-Neng,MITTON, Jeffrey, D.
- Current Assignee Address: 210 Elliot Avenue West, Suite 300 Seattle, WA 98119 US
- Agency: ANTLER, Adriane, M. et al.
- Priority: US60/802,862 20060522
- Main IPC: G06F19/00
- IPC: G06F19/00
Abstract:
Methods, computers, and computer program products for detecting the presence of a probe within a sample overlayed on a substrate are provided. The probe comprises a plurality of spatially arranged labels. A data storage module stores a plurality of light images, where each light image has light from the sample at a corresponding wavelength range in a plurality of different wavelength ranges. A label identification module identifies a plurality of labels in the plurality of light images that are proximate to each other on the substrate. A spatial order of the plurality of labels determines a string sequence of the plurality of labels. A probe identification module determines whether the string sequence of the plurality of labels comprises a valid reporter sequence.
Information query