Invention Application
- Patent Title: PROBING APPARATUS WITH GUARDED SIGNAL TRACES
- Patent Title (中): 具有保护信号跟踪的探测设备
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Application No.: PCT/US2007086199Application Date: 2007-11-30
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Publication No.: WO2008070590A3Publication Date: 2008-11-13
- Inventor: ELDRIDGE BENJAMIN N , REYNOLDS CARL V , SAEKI TAKAO , URAKAWA YOICHI
- Applicant: FORMFACTOR INC , ELDRIDGE BENJAMIN N , REYNOLDS CARL V , SAEKI TAKAO , URAKAWA YOICHI
- Assignee: FORMFACTOR INC,ELDRIDGE BENJAMIN N,REYNOLDS CARL V,SAEKI TAKAO,URAKAWA YOICHI
- Current Assignee: FORMFACTOR INC,ELDRIDGE BENJAMIN N,REYNOLDS CARL V,SAEKI TAKAO,URAKAWA YOICHI
- Priority: US56619406 2006-12-01
- Main IPC: G01R31/02
- IPC: G01R31/02
Abstract:
probing apparatus can comprise a substrate, conductive signal traces, probes, and electromagnetic shielding. The substrate can have a first surface and a second surface opposite the first surface, and the electrically conductive first signal traces can be disposed on the first surface of the first substrate. The probes can be attached to the first signal traces, and the electromagnetic shielding structures can be disposed about the signal traces.
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