Invention Application
- Patent Title: EFFECTIVE-INDUCTANCE-CHANGE BASED MAGNETIC PARTICLE SENSING
- Patent Title (中): 基于有效电感变化的磁性粒子感测
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Application No.: PCT/US2009036368Application Date: 2009-03-06
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Publication No.: WO2009148668A3Publication Date: 2010-03-04
- Inventor: WANG HUA , HAJIMIRI SEYED ALI , CHEN YAN
- Applicant: CALIFORNIA INST OF TECHN , WANG HUA , HAJIMIRI SEYED ALI , CHEN YAN
- Assignee: CALIFORNIA INST OF TECHN,WANG HUA,HAJIMIRI SEYED ALI,CHEN YAN
- Current Assignee: CALIFORNIA INST OF TECHN,WANG HUA,HAJIMIRI SEYED ALI,CHEN YAN
- Priority: US6851308 2008-03-07
- Main IPC: G01N27/72
- IPC: G01N27/72 ; G01N27/00 ; G01R33/02
Abstract:
The invention relates to an integrated measurement system to detect a quantity of magnetic particles in a sample. The measurement system includes a substrate. An electromagnetic (EM) structure disposed on the surface of the substrate is configured to receive a sample including the magnetic particles in proximity thereof. The integrated measurement system also includes an electrical current generator disposed on the surface of the substrate which is electro-magnetically coupled to the EM structure. The electrical current generator is configured to cause an electrical current to flow in the EM structure. The integrated measurement system also includes an effective inductance sensor disposed on the surface of the substrate which is configured to measure a selected one of an effective inductance and a change in effective inductance. The invention also relates to a method to determine the number of and/or the locations of the magnetic particles in a sample.
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