Invention Application
- Patent Title: UNIVERSAL METHYLATION PROFILING METHODS
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Application No.: PCT/US2009/004257Application Date: 2009-07-22
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Publication No.: WO2010011312A9Publication Date: 2010-01-28
- Inventor: BESTOR, Timothy, H. , EDWARDS, John, R. , JU, Jingyue , LI, Xiaoxu
- Applicant: THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK , BESTOR, Timothy, H. , EDWARDS, John, R. , JU, Jingyue , LI, Xiaoxu
- Applicant Address: West 116th and Broadway New York, NY 10027 US
- Assignee: THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK,BESTOR, Timothy, H.,EDWARDS, John, R.,JU, Jingyue,LI, Xiaoxu
- Current Assignee: THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK,BESTOR, Timothy, H.,EDWARDS, John, R.,JU, Jingyue,LI, Xiaoxu
- Current Assignee Address: West 116th and Broadway New York, NY 10027 US
- Agency: WHITE, John, P.
- Priority: US61/135,714 20080722
- Main IPC: C07H19/16
- IPC: C07H19/16 ; A61K31/7076
Abstract:
This invention provides methods of derivatizing a double-stranded DNA comprising contacting double-stranded DNA with a CpG methyltransf erase and an s-adenosylmethionine analog. This invention also provides methods of sequencing DNA to determine methylation patterns. This invention also provides neobases and methods of sequencing for methylation patterns using neobases.
Information query
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