Invention Application
WO2010080069A3 SHIELDING AND PROTECTING ELEMENTS FOR PLASMA DOPING AND THEIR MAINTAINANCE
审中-公开
屏蔽和保护等离子体的元素及其维护
- Patent Title: SHIELDING AND PROTECTING ELEMENTS FOR PLASMA DOPING AND THEIR MAINTAINANCE
- Patent Title (中): 屏蔽和保护等离子体的元素及其维护
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Application No.: PCT/SG2009000302Application Date: 2009-08-28
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Publication No.: WO2010080069A3Publication Date: 2011-03-17
- Inventor: TAY KIANG MENG , MAH EUGENE WEI KHAI , LIEW HUAY MEEI , TAY TECK KWANG , LEE CHUA BONG , CHONG SHI CHAI , WHITE JAMES EDWARD , CARUSO RUDOLPH JOHN , SIMON DANIEL ALLEN , RAHME ELIE EID
- Applicant: FRONTKEN SINGAPORE PTE LTD , VARIAN SEMICONDUCTOR EQUIPMENT , TAY KIANG MENG , MAH EUGENE WEI KHAI , LIEW HUAY MEEI , TAY TECK KWANG , LEE CHUA BONG , CHONG SHI CHAI , WHITE JAMES EDWARD , CARUSO RUDOLPH JOHN , SIMON DANIEL ALLEN , RAHME ELIE EID
- Assignee: FRONTKEN SINGAPORE PTE LTD,VARIAN SEMICONDUCTOR EQUIPMENT,TAY KIANG MENG,MAH EUGENE WEI KHAI,LIEW HUAY MEEI,TAY TECK KWANG,LEE CHUA BONG,CHONG SHI CHAI,WHITE JAMES EDWARD,CARUSO RUDOLPH JOHN,SIMON DANIEL ALLEN,RAHME ELIE EID
- Current Assignee: FRONTKEN SINGAPORE PTE LTD,VARIAN SEMICONDUCTOR EQUIPMENT,TAY KIANG MENG,MAH EUGENE WEI KHAI,LIEW HUAY MEEI,TAY TECK KWANG,LEE CHUA BONG,CHONG SHI CHAI,WHITE JAMES EDWARD,CARUSO RUDOLPH JOHN,SIMON DANIEL ALLEN,RAHME ELIE EID
- Priority: SG2009000357 2009-01-06
- Main IPC: H01L21/223
- IPC: H01L21/223 ; H01J37/32
Abstract:
Techniques and systems for maintaining a plasma processing kit consisting of protection and shielding elements without causing damage are introduced. The elements may be made of aluminium, polysilicon and quartz and may be coated with silicon. The surfaces of the elemants show a specified roughness. Precision cleaning and recovery of the contamined kit components of a plasma doping (PLAD) system is used, to extend the life and reusability of the components. The methods described cover the stages of inspection, pre-cleaning, mechanical processing and texturing, post-cleaning, clean-room class cleaning and packaging of the components consisting of quartz, aluminium and/or silicon. Techniques described employ the combination of a variety of means (primarily chemical and mechanical) to achieve the desired levels of cleanliness. The result obtained by methods that include Inductively Coupled Plasma-Mass Spectrometry (ICP-MS) and Laser Particle Count affirm the efficacy of these techniques.
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