Invention Application
- Patent Title: SYSTEMS AND METHODS FOR MONITORING A MEMORY SYSTEM
- Patent Title (中): 用于监视存储器系统的系统和方法
-
Application No.: PCT/US2010020786Application Date: 2010-01-12
-
Publication No.: WO2010081157A3Publication Date: 2010-10-21
- Inventor: JEDDELOH JOE M
- Applicant: MICRON TECHNOLOGY INC , JEDDELOH JOE M
- Assignee: MICRON TECHNOLOGY INC,JEDDELOH JOE M
- Current Assignee: MICRON TECHNOLOGY INC,JEDDELOH JOE M
- Priority: US35238109 2009-01-12
- Main IPC: G06F11/30
- IPC: G06F11/30 ; G06F12/00
Abstract:
Systems and methods are disclosed herein, including those that operate to monitor a first set of operational parameters associated with a memory vault, to adjust a second set of operational parameters associated with the memory vault, and to perform alerting and reporting operations to a host device.
Information query
