Invention Application
- Patent Title: OPTICAL MEASURING METHOD AND SYSTEM
- Patent Title (中): 光学测量方法与系统
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Application No.: PCT/GB2010/000088Application Date: 2010-01-20
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Publication No.: WO2010084314A1Publication Date: 2010-07-29
- Inventor: JONES, Nicholas, Henry, Hannaford , WESTON, Nicholas, John , JONAS, Kevyn, Barry , SHEPHARD, Johathan, Dale , HAND, Duncan, Paul , MATYSIAK, Mateusz
- Applicant: RENISHAW PLC , JONES, Nicholas, Henry, Hannaford , WESTON, Nicholas, John , JONAS, Kevyn, Barry , SHEPHARD, Johathan, Dale , HAND, Duncan, Paul , MATYSIAK, Mateusz
- Applicant Address: New Mills Wotton-Under-Edge Gloucestershire GL12 8JR GB
- Assignee: RENISHAW PLC,JONES, Nicholas, Henry, Hannaford,WESTON, Nicholas, John,JONAS, Kevyn, Barry,SHEPHARD, Johathan, Dale,HAND, Duncan, Paul,MATYSIAK, Mateusz
- Current Assignee: RENISHAW PLC,JONES, Nicholas, Henry, Hannaford,WESTON, Nicholas, John,JONAS, Kevyn, Barry,SHEPHARD, Johathan, Dale,HAND, Duncan, Paul,MATYSIAK, Mateusz
- Current Assignee Address: New Mills Wotton-Under-Edge Gloucestershire GL12 8JR GB
- Agency: WILLIAMS, Sarah, Caroline et al.
- Priority: GB0901040.6 20090122
- Main IPC: G01N21/35
- IPC: G01N21/35 ; G01N21/88
Abstract:
A detecting system for detecting flaws in a sample (310) comprises an illumination assembly (320, 322) and detecting assembly (350, 354). The illumination assembly has an infra-red light source (320) and illumination optics (322) for directing a beam of light from the light source to a spot (346) on or within a sample. The detection assembly has a detector (354) for detecting light from an illuminated spot on or within a sample and detection optics (350) for directing light from an illuminated spot on or within a sample to the detector (354). Such a system may be used for determining flaws in a sample such as a thermal barrier coating on a turbine blade, or a dental or other medical part. In particular the system may be used for determining, flaws in a ceramic sample. A method for detecting flaws in a sample is further described.
Information query
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