Invention Application
WO2010084314A1 OPTICAL MEASURING METHOD AND SYSTEM 审中-公开
光学测量方法与系统

OPTICAL MEASURING METHOD AND SYSTEM
Abstract:
A detecting system for detecting flaws in a sample (310) comprises an illumination assembly (320, 322) and detecting assembly (350, 354). The illumination assembly has an infra-red light source (320) and illumination optics (322) for directing a beam of light from the light source to a spot (346) on or within a sample. The detection assembly has a detector (354) for detecting light from an illuminated spot on or within a sample and detection optics (350) for directing light from an illuminated spot on or within a sample to the detector (354). Such a system may be used for determining flaws in a sample such as a thermal barrier coating on a turbine blade, or a dental or other medical part. In particular the system may be used for determining, flaws in a ceramic sample. A method for detecting flaws in a sample is further described.
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